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We offer a comprehensive choice of standard pin stubs to support virtually all applications. The standard SEM pin stubs are compatible with Thermo Fisher, FEI, Philips, Tescan, Phenom, Aspex, RJLee, AmRay, Cambridge Instruments, Leica, CamScan, Aspex, ETEC and Novascan SEMs. They are made from vacuum grade aluminium. They are machined according to the original manufacturer's specifications and dimensions. The flat pin stubs from 12.7mm to 38mm diameter are grooved for easy and clean handling. The most used pin stubs are the ?12.7 mm and the ?25.4 mm pin stubs. Pins are all 3.2mm diameter with a length of either 8mm or 9.5mm. The ?12.7 mm pin stubs are also available in brass, copper and high purity carbon.
The full range of standard SEM pin stubs and mounts include:
6.4, 9.5, 12.7, 19, 25.4, 32, 38, 50, 63 and 100mm stub diameter
Special 12.7mm stub diameter with a flate side and 12.7mm stub in brass and copper.
Angled pin stubs to quickly image or analyse a sample under 30°, 45°, 70° or 90° w/o tilting the sample stage:
12.7mm stub diameter with 30°, 45°, 45/90° and 70° pre-tilt in various heights
25mm diameter with 45°, 45/90°, double 45/90° and double 90°
32mm diameter with 45°and double 90°
Flat Pin stubs with extra height. Useful for marking, shorter working distance or to make your own custom stubs. Available as:
12.7mm diameter with 4mm and 6mm extra height and 25.4mm diameter with 4mm extra height
Low profile 12.7 and 25mm pin stubs to enable very short working distances for high resolution SEM imaging and FIB operations. Horizontal (flat), 90° pre-tilt, 38° pre-tilt (for FEI systems) and 35° pre-tilt (Tescan systems)
Engraved pin stubs with lines and numbers for mounting multiple samples or for relocating a sample. Stub diameters are 12.7, 19, 25.4 and 32mm.
Swivel pin mount with a top diameter of 15mm which can be tilted 90o both ways.
Dish cylinder stub with 12.7mm stub diameter for sample preparation of solutions or fluids directly on the stub. The dish design prevent fluid from dripping of the stub. Sample can be dried on the SEM stub.
Cambridge S4 stub, which is not a pin stub but used on many SEMs with pin stubs. A Cambridge S4 holder or Cambridge S4 adapter is needed for the Cambridge S4 stub.
SEM pin stub extenders to quickly adjust height and bring samples closer to the polepiece.
If you need an SEM sample pin stub which is not offered in the list below, please contact us. We can manufacture custom sample stubs or suggest a solution with other sample stubs.
南京覃思科技有限公司成立于2004年,总部位于南京,在北京设有分公司,业务覆盖全国及港澳地区。公司专注于电子光学与实验室科研领域的仪器及耗材销售与技术服务,主要产品涵盖电子显微镜、光学显微镜、X射线、Micro CT 等相关仪器及配套软硬件。
作为多家国际知名品牌的中国区授权代理,覃思科技长期合作的品牌包括:荷兰 Delmic、美国 JC Nabity、瑞士 Safematic、美国 Tousimis、加拿大 Dragonfly、荷兰 ASI、美国 PIE Scientific、法国 TRAD、丹麦 DeltaPix、加拿大 KA Imaging、韩国 LabSpinner 和荷兰 Micro to Nano。
此外,我们也提供一系列自研和国产配套产品,如 TS3000 清洁度检查系统、ACCUR 系列电动扫描平台,并承接显微镜数字化改造及微束分析类非标定制服务。
我们的客户广泛分布于高校、科研院所、医疗机构、政府机关及工业企业,长期合作单位包括北大、清华、浙大、南大、东大、复旦、同济、上海交大、中科大等名校;中科院微生物所、遗传所、生物物理所、近代物理所、微电子所、等离子所、植生所、水生所、寒旱所、金属所、海洋三所、上海光机所、长春应化所、山西煤化所、广州能源所、上海石化院、大庆油田、胜利油田、国家纳米中心、紫金山天文台等知名科研机构;广西、山东、宁波等检验检疫局,北京法医鉴定中心等国家机构;Intel英特尔、博世Bosch、希捷Seagate等跨国企业;华为、天马、首钢等国内骨干企业。
公司秉持“诚信经营、诚实服务”的宗旨,致力于为客户提供先进可靠的产品与专业周到的服务,愿与各界携手共进,共创未来。
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